Advanced Materials Characterization: Microscopy
Spring 2024
Details
Credit
3Mode
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LectureMeets
Instructors
Stephen NonnenmannDescription
This course covers the fundamental principles behind characterization approaches such as electron microscopy, x-ray diffraction, atomic force microscopy, and synchrotron techniques. This is typically supplemented by some in lab demonstrations of the techniques, where a dataset is generated, and students write a report (3 pages) forming conclusions based on the foundation they learned in lecture. By the end of the semester students should be able to make an informed selection of the appropriate characterization methods to address a specific research challenge.
Eligibility
Open to Graduate students only.
Notes
Lectures are supplemented by 4-5 laboratory demonstrations of the techniques throughout the term.
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