June 9, 2014 The staff of the W. M. Keck Electron Microscopy Center at UMass Amherst with the JEOL 2200fs field emission – energy-filtered transmission electron microscope and its control station. From left are Alexander E. Ribbe, director of the center, and senior electron microscopists Dale A. Callaham and Louis E. Raboin. This high resolution scanning electron microscope image of a carbon nanotube mesh was taken with the FEI Magellan 400 HR-SEM. The smallest detectable diameter is 2 nm. 1 nm (nanometer) is a billionth of a meter. This is the control station for the JEOL 2200fs field emission – energy-filtered transmission electron microscope. Powering the UMass Amherst electron microscopy center are the JEOL 2200fs field emission – energy-filtered transmission electron microscope, left, and the FEI Magellan 400 ultra-high-resolution scanning electron microscope. This is a high angle annular dark field image (HAADF) image of a polymer loaded with cadmium-selenide and iron-oxide nanoparticles taken with the scanning transmission detector in the FEI Magellan 400 high resolution scanning electron microscope. The length of structure is about 500 nm. This box is part of the control station for the JEOL 2200fs electron microscope. This high-resolution gold lattice image at 1 million times magnification was acquired with the new JEOL 2200FS being installed at the UMass Amherst electron microscopy center. Inset in the image is a calculated diffraction pattern (Fourier Transform) of the picture demonstrating up to 0.1 nm lattice resolution. This is an Oxford X-Max 80T energy dispersive X-ray spectrometer. Both electron microscopes at the UMass center have a version of this. Previous Next The W.M. Keck Electron Microscopy Center at the University of Massachusetts Amherst is consolidating two sophisticated electron microscopes and a team of expert operators to provide centralized services for all departments on campus.