Director, Electron Microscopy Center & Atomic Force Microscopy
Interm Director, X-Ray Scattering
Interm Director, X-Ray Scattering
Transmission (TEM) and Scanning (SEM) Electron Microscopes as well as related sample preparation equipment..
Provide analytical and high resolution scanning probed based microscopy, including Atomic Force Microscopy (AFM) related techniques as well as force measurements.
Housing several instruments dedicated to the structural analysis of crystalline materials, the determination of highly periodic morphologies in self-assembled systems over a large length scale range.