Electron Microscopy
COVID-19 Status
Technical Staff will work remotely.
No in-person training.
User access-status update soon.
Equipped with several Transmission (TEM) and Scanning (SEM) Electron Microscopes as well as related sample preparation equipment for the use of the UMass community as well as external customers. The Center serves both materials and life-sciences communities and most of the instruments options are focused on analytical capabilities such as Energy Dispersive X-Ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS).
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JEOL- JEM-2200FS Energy Filtered Transmission Electron Microscope
The JEOL JEM-2200FS EFTEM features an in-column Electron Energy Loss Filter for EELS and EFTEM and an Oxford X-MAX 80mm2 Energy Dispersive X-ray Spectrometer. The instrument is setup for analytical applications such as Electron Tomography while still maintaining high-resolution in High Angle Annular Dark Field Imaging.
- Schottky Thermal Field Emitter Source
- Oxford 80mm2 X-Max Energy Dispersive X-ray Spectrometer (EDS)
- Scanning Transmission Electron Microscopy with HAADF
- Electron Tomography (TEMT)
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FEI Magellan 400 XHR-SEM
The FEI Magellan 400 XHR-SEM is a thermal field emitter base high resolution microscope featuring an Oxford X-MAX 80mm2 Energy Dispersive X-ray Spectrometer for element mapping. Low-Voltage Scanning Transmission Electron Microscopy with HAADF.
- Schottky Thermal Field Emitter Source
- Oxford 80mm2 X-Max Energy Dispersive X-ray Spectrometer (EDS)
- Low-Voltage Scanning Transmission Electron Microscopy with HAADF
- Electron Backscattering Diffraction (EBSD)
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FEI Tecnai-T12 TEM
The FEI Tecnai-T12 is a life sciences oriented Electron Microscope capable of imaging at cryo-temperatures.
- LaB6 Source
- 80-120kV Acceleration Voltage
- Cryo-Transfer
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Bruker (Digital Instruments) Dimensions 3100
Scanning Probe Microscope
- Nanoscope IIIa Controller
- Tapping Mode
- Contact Mode
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Bruker (Digital Instruments) MultiMode
Scanning Probe Microscope
- Nanoscope IV Controller
- Tapping Mode
- Contact Mode
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Balzers Critical Point Dryer
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Cressington 108 Sputter Coater
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Cressington 208 Sputter Coater
| Campus Users - Hourly Rates | |
| JEOL 2200FS | $75 |
| FEI Magellan 400 | $55 |
| JEOL 2000FX, 6320 FVX | $55 |
| FEI Tecnai T12 | $55 |
| Sputter Coater CR108 | $5/sample |
| Sputter Coater CR208 | $7/sample |
| Ultramicrotome (any) | $20 |
| Balzers Critical Point Dryer | $20 |
| FEI Vitrobot - Plunge Freezer | $20 |
| Campus Users - Staff Assisted - Hourly Rates | |
| JEOL 2200FS | $95 |
| FEI Magellan 400 | $75 |
| JEOL 2000FX, 6320 FVX | $75 |
| FEI Tecnai T12 | $75 |
| Ultramicrotome (any) | $40 |
| Balzers Critical Point Dryer | $40 |
| FEI Vitrobot - Plunge Freezer | $40 |
| External Users - Hourly Rates | |
| ISU (Industry Self Use) - Any Instrument | $150 |
| ISU + Staff Assistance | $250 |
| ISU + Director Assistance | $300 |
| Liquid Nitrogen: sold at cost | |
| Rates are subject to change, contact facility to verify current fees. | |
Electron Microscopy: Equipped with several Transmission (TEM) and Scanning (SEM) Electron Microscopes as well as related sample preparation equipment for the use of the UMass community as well as external customers. The Center serves both materials and life-sciences communities and most of the instruments options are focused on analytical capabilities such as Energy Dispersive X-Ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS). Equipment includes: JEOL- JEM-2200FS EFTEM, JEOL 2000FX TEM, FEI Magellan 400 XHR-SEM, and a FEI Tecnai-T12 TEM
FY21 Specialized Service Center Approved Fees
Updated January 2021
CORUM (access and reservations)
