Electron Microscopy

The JEOL JEM-2200FS EFTEM features an in-column Electron Energy Loss Filter for EELS and EFTEM and an Oxford X-MAX 80mm2 Energy Dispersive X-ray Spectrometer. The instrument is setup for analytical applications such as Electron Tomography while still maintaining high-resolution in High Angle Annular Dark Field Imaging.

• Schottky Thermal Field Emitter Source
• Oxford 80mm2 X-Max Energy Dispersive X-ray Spectrometer (EDS)
• Scanning Transmission Electron Microscopy with HAADF
• Electron Tomography (TEMT)

The FEI Magellan 400 XHR-SEM is a thermal field emitter base high resolution microscope featuring an Oxford X-MAX 80mm2 Energy Dispersive X-ray Spectrometer for element mapping. Low-Voltage Scanning Transmission Electron Microscopy with HAADF.

• Schottky Thermal Field Emitter Source
• Oxford 80mm² X-Max Energy Dispersive X-ray Spectrometer (EDS)
• Low-Voltage Scanning Transmission Electron Microscopy with HAADF
• Electron Backscattering Diffraction (EBSD)

The FEI Tecnai-T12 is a life sciences oriented Electron Microscope capable of imaging at cryo-temperatures.

• LaB₆ Source
• 80-120kV Acceleration Voltage
• Cryo-Transfer

Cryo-Ultramicrotome

Ultramicrotome

Plunge Freeze

Cressington 108 Sputter Coaters are ideal for routine sample preparation. Compact, economical and simple to operate, they offer rapid pumpdown times, fine-grain coatings and negligible sample heating.

The Cressington 208HR High Resolution Sputter Coaters offer real solutions to the problems encountered when coating difficult samples for FESEM imaging. FESEM applications need extreme- ly thin, fine grain, uniform coatings to eliminate charg- ing and to improve contrast on low density materials.

• 100 kV accelerating voltage
• X-FEG source
• Ceta-F CMOS Camera
• Negative stain or cryo samples 
• Automated data collection