Atomic Force Microscopy (AFM)
Atomic Force Microscope (AFM): The facility provides analytical and high resolution scanning probe based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contact mode or conductive AFM as well as force measurements. Equipment includes a Bruker MultiMode AFM for high resolution, a Bruker Dimensions AFM for large scale samples, and an Oxford Asylum MFP-3D for specialized experiments.