Atomic Force Microscopy (AFM)


Palladium Nanoparticles 3D topography

High Resolution Scanning Probe Microscopy

The mission of the Scanning Probe Microscopy Core is to provide analytical and high resolution scanning probed based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contract mode or conductive AFM as well as force measurements.

  • Bruker MultiMode AFM for high resolution
  • Bruker Dimensions AFM for large scale samples
  • Oxford Asylum MFP-3D for specialized experiments
Watch Core Facilities Seminar: Atomic Force Microscopy on YouTube.
Tuesday, April 6, 2021

Atomic Force Microscopy

2:00 pm

Keith Dusoe, Postdoctoral Research Associate, Polymer Science & Engineering, IALS–“Scanning Probe Microscopy: Capabilities and Possibilities.”

Staff

    • Location

    B343 Silvio O. Conte National Center for Polymer Research
    University of Massachusetts Amherst
    120 Governors Drive
    Amherst, MA 01003