
High Resolution Scanning Probe Microscopy
Staff
Location
B343 Silvio O. Conte National Center for Polymer Research
University of Massachusetts Amherst
120 Governors Drive
Amherst, MA 01003
The mission of the Scanning Probe Microscopy Core is to provide analytical and high resolution scanning probed based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contract mode or conductive AFM as well as force measurements.
B343 Silvio O. Conte National Center for Polymer Research
University of Massachusetts Amherst
120 Governors Drive
Amherst, MA 01003