AFM facility

Atomic Force Microscopy (AFM)

Announcements

Core Facilities Seminar

Keith Dusoe, Postdoctoral Research Associate, Polymer Science & Engineering, IALS–Scanning Probe Microscopy: Capabilities and Possibilities

Replay on YouTube

The mission of the Scanning Probe Microscopy Core is to provide analytical and high resolution scanning probed based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contract mode or conductive AFM as well as force measurements.

  • Asylum MFP-3D Scanning Probe Microscope

    Contact/Tapping Mode

    afm.oxinst.com

  • Bruker (Digital Instruments) MultiMode

    Scanning Probe Microscope

    • Nanoscope IV Controller
    • Tapping Mode
    • Contact Mode

    bruker.com

  •  

    Bruker Dimensions AFM

    for large scale samples

  Campus Other Academic Industry
Any Instrument (AFM, Nanoindenter) $25/hour $150/hour $150/hour
Any Instrument (AFM, Nanoindenter) with Staff Assistance $45/hour $250/hour $250/hour
Any Instrument (AFM, Nanoindenter) with Director Assistance   $300/hour $300/hour
AFM Probes: sold at cost
Rates are subject to change, contact facility to verify current fees.

FY24 Specialized Service Center Approved Fees

Atomic Force Microscope (AFM): The facility provides analytical and high resolution scanning probe based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contact mode or conductive AFM as well as force measurements. Equipment includes a Bruker MultiMode AFM for high resolution, a Bruker Dimensions AFM for large scale samples, and an Oxford Asylum MFP-3D for specialized experiments.

FY24 Specialized Service Center Approved Fees

 Updated July 2023