Atomic Force Microscopy (AFM)
Core Facilities Seminar
Keith Dusoe, Postdoctoral Research Associate, Polymer Science & Engineering, IALS–Scanning Probe Microscopy: Capabilities and Possibilities
The mission of the Scanning Probe Microscopy Core is to provide analytical and high resolution scanning probed based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contract mode or conductive AFM as well as force measurements.
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Bruker (Digital Instruments) MultiMode
Scanning Probe Microscope
- Nanoscope IV Controller
- Tapping Mode
- Contact Mode
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Bruker Dimensions AFM
for large scale samples
| Service Line | Campus | Other Academic | Industry |
|---|---|---|---|
| Any Instrument (AFM, Nanoindenter) | $26/hour | $160/hour | $160/hour |
| Any Instrument (AFM, Nanoindenter) with Staff Assistance | $47/hour | $256/hour | $265/hour |
| Any Instrument (AFM, Nanoindenter) with Director Assistance | $320/hour | $320/hour | |
| AFM Probes: sold at cost | |||
| Rates are subject to change, contact facility to verify current fees. | |||
| FY25 Specialized Service Center Approved Fees | |||
Atomic Force Microscope (AFM): The facility provides analytical and high resolution scanning probe based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contact mode or conductive AFM as well as force measurements. Equipment includes a Bruker MultiMode AFM for high resolution, a Bruker Dimensions AFM for large scale samples, and an Oxford Asylum MFP-3D for specialized experiments.
