UMassAmherst: Research, Educational Measurement, and Psychometrics (REMP)
Research, Educational Measurement, and Psychometrics (REMP)

International Conferences in Summer 2008!

Globe A number of faculty and staff from the Research, Educational Measurement, and Psychometrics (REMP) concentration / Center for Educational Assessment will be traveling overseas this summer to attend and speak at the International Test Commission's 6th Conference focusing on "The Impact of Testing on People and Society: Enhancing the Value of Test Use". This meeting will take place in Liverpool, England on July 14-16, 2008, and will also feature a keynote address from Professor Ronald K. Hambleton on "A Key for Valid Uses of Tests: Making Test Score Reports More Understandable and User-Friendly".

UMass presentations in Liverpool include:
Using item response theory models to construct tests and equate and report scores [workshop]
Craig S. Wells, Ronald K. Hambleton - University of Massachusetts Amherst, USA

Constructing and Evaluating Customized Test Score Norms [paper]
Ronald Hambleton - University of Massachusetts Amherst, USA

Have My Test Items Been Stolen? Item Statistics to Find Out [paper]
Ronald Hambleton - University of Massachusetts Amherst, USA; Ning Han - Educational Testing Service

Communicating results of comparisons of international assessments with NAEP [in NAEP symposium]
Stephen G. Sireci - University of Massachusetts Amherst, USA

Communicating the results of score equity assessment [in NAEP symposium]
Craig Wells - University of Massachusetts Amherst, USA

Communicating the utility of NAEP score reports [in NAEP symposium]
April L. Zenisky, Ronald K. Hambleton, and Stephen G. Sireci - University of Massachusetts Amherst, USA

Customizing the View: Evaluating the Communication of National Assessment Results [paper]
April L. Zenisky, Ronald K. Hambleton, and Stephen G. Sireci - University of Massachusetts Amherst, USA

The use of 'standardized coding schemes' to analyse construct equivalence via cognitive interviewing [paper]
Jose-Luis Padilla - University of Granada; Stephen G. Sireci - University of Massachusetts



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