UMass Amherst

Joseph I. Goldstein

Distinguished Professor, Dept. of Mechanical & Industrial Engineering
313 Engineering Lab, University of Massachusetts
Amherst, MA 01003-9292
(413) 545-2165
Jig0@ecs.umass.edu
http://www.ecs.umass.edu/mie/faculty/goldstein.html

Characterization and Formation of Nanomaterials

My current research interests are: 1) the application of electron microscopy to the characterization of materials at the nano level, and 2) the simulation of solid state phase transformations by computer techniques. Particular interests in the area of electron microscopy include the use of x-ray analysis in the analytical electron microscope and the electron probe microanalyzer, sample preparation by focused ion beam (FIB), and electron backscatter diffraction (EBSD). In addition to materials characterization we use data obtained by electron microscopy to obtain fundamental parameters such as solid state diffusion coefficients and phase diagrams. Our computer simulation work is applied to diffusion controlled phase transformations, spinodal decomposition, and order-disorder reactions. I have current interests in the development of new materials for electronic applications, batteries, and improved solid state bonding.

Research Interest Potential Application
Electron Microscopy Characterization of Materials at the Nano Level
Computer Simulation Manufacturing Processes for Nanomaterials

Honors and Awards

  • Leonard Medal, Meteoritical Society, 2005
  • Henry Clifton Sorby Award (lifetime achievement in metallurgy), International Metallographic Society, 1999
  • Dean of the College of Engineering, UMass Amherst, 1993-2004
  • Vice President for Graduate Studies and Research, Lehigh University, 1983-90

Publications

  1. "Future Directions of X-ray Microanalysis in the Analytical Electron Microscope," J. I. Goldstein, Proceedings 5th Asia-Pacific Electron Microscopy Conference, Beijing, China, ed. K. H. Kuo and Z. H. Zhai, World Scientific Publishing, Singapore, China, 138-141 (1992).
  2. "Definition of the Spatial Resolution of X-ray Microanalysis in Thin Foils," D. B. Williams, J. R. Michael, J. I. Goldstein, and A. D. Romig, Jr., Ultramicroscopy, 47, 121-132 (1992).
  3. "The Influence of Oxide Surface Layers on Bulk Electron Probe Microanalysis of Oxygen-Application to Ti-Si-O Compounds," J. I. Goldstein, S. K. Choi, F. J. J. van Loo, H. J. M. Heijligers, G. F. Bastin, and W. G. Sloof, Scanning, Vol. 15, 165-170 (1993).
  4. "High-performance X-ray detection in a new analytical electron microscope," C.E. Lyman, J.I. Goldstein, D.B. Williams, D.W. Ackland, S. Von Harrach, A.W. Nicholls & P.J. Statham, Journal of Microscopy, Vol. 176, pt. 2, pp.85-98 (1994).
  5. "Determination of the Fe-Rich Portion of the Fe-Ni-S Phase Diagram" L. Ma, D.B. Williams, J.I. Goldstein, Journal of Phase Equilibria, Vol. 19, No. 4, pp. 299-309, (1998).