Atomic Force Microscopy (AFM)
The mission of the Scanning Probe Microscopy Core is to provide analytical and high resolution scanning probed based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contract mode or conductive AFM as well as force measurements.
- Bruker MultiMode AFM for high resolution
- Bruker Dimensions AFM for large scale samples
- Oxford Asylum MFP-3D for specialized experiments
| Campus Users | Other Academic Institutions | Industry | |
|---|---|---|---|
| Any Instrument (AFM, Nanoindenter) | $15/hour | $150/hour | $150/hour |
| Any Instrument (AFM, Nanoindenter) with Staff Assistance | $25/hour | $250/hour | $250/hour |
| Any Instrument (AFM, Nanoindenter) with Director Assistance | $300/hour | $300/hour | |
| AFM Probes: sold at cost | |||
| Rates are subject to change, contact facility to verify current fees. | |||
| Updated March 13, 2017 | |||