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AFM facility

Atomic Force Microscopy (AFM)

The mission of the Scanning Probe Microscopy Core is to provide analytical and high resolution scanning probed based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contract mode or conductive AFM as well as force measurements.

  • Bruker MultiMode AFM for high resolution
  • Bruker Dimensions AFM for large scale samples
  • Oxford Asylum MFP-3D for specialized experiments
  Campus Users Other Academic Institutions Industry
Any Instrument (AFM, Nanoindenter) $15/hour $150/hour $150/hour
Any Instrument (AFM, Nanoindenter) with Staff Assistance $25/hour $250/hour $250/hour
Any Instrument (AFM, Nanoindenter) with Director Assistance   $300/hour $300/hour
AFM Probes: sold at cost
Rates are subject to change, contact facility to verify current fees.
Updated March 13, 2017
Facility Staff
Location

B343 Silvio O. Conte National Center for Polymer Research
University of Massachusetts Amherst
120 Governors Drive
Amherst, MA 01003

Directions/Parking

Centers