Atomic Force Microscopy (AFM)
COVID-19 Status
Currently non-operational. Contact facility staff for questions.
The mission of the Scanning Probe Microscopy Core is to provide analytical and high resolution scanning probed based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contract mode or conductive AFM as well as force measurements.
- Bruker MultiMode AFM for high resolution
- Bruker Dimensions AFM for large scale samples
- Oxford Asylum MFP-3D for specialized experiments
| Campus Users | Other Academic Institutions | Industry | |
|---|---|---|---|
| Any Instrument (AFM, Nanoindenter) | $20/hour | $150/hour | $150/hour |
| Any Instrument (AFM, Nanoindenter) with Staff Assistance | $40/hour | $250/hour | $250/hour |
| Any Instrument (AFM, Nanoindenter) with Director Assistance | $300/hour | $300/hour | |
| AFM Probes: sold at cost | |||
| Rates are subject to change, contact facility to verify current fees. | |||
Atomic Force Microscope (AFM): The facility provides analytical and high resolution scanning probe based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as tapping mode, contact mode or conductive AFM as well as force measurements. Equipment includes a Bruker MultiMode AFM for high resolution, a Bruker Dimensions AFM for large scale samples, and an Oxford Asylum MFP-3D for specialized experiments.
FY21 Specialized Service Center Approved Fees
Updated January 2021
